With X-ray Diffraction (XRD), samples are excited with x-rays at changing angles, and the emitted X-rays are detected as a function of angle. XRD measurements provide routine identification and quantification of crystal phases in powder and polycrystalline samples. Percent crystallinity, residual stress, crystallite size, lattice strain and thin film measurements are also possible.

The EDX-7000/8100 energy dispersive XRF spectrometers incorporate five primary filters and four collimators. Usable in any combination, the filters enable highly sensitive EDXRF analysis of trace elements while the four different sized collimators reduce scattering with small samples or isolation of measurement area.

The EDX-8100 model features an SDD detector with a special ultra-thin-film window material that is able to detect ultra-light elements such as carbon (C), oxygen (O), and fluorine (F).